1. Structural and Chemical Characterization of Cerium Oxide Thin Layers Grown on Silicon Substrate. (2015) Authors: Potin, V.; Lavkova, J.; Bourgeois, S.; Dubau, M.; Matolinova, I.; Matolin, V. Journal: Materials today Issue: Volume 2:Number 1(2015) Page Start: 101 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗