1. Forward bias capacitance investigation as a powerful tool to monitor graphene/silicon interfaces. (15th September 2021) Authors: Matacena, Ilaria; Guerriero, Pierluigi; Lancellotti, Laura; Bobeico, Eugenia; Lisi, Nicola; Chierchia, Rosa; Delli Veneri, Paola; Daliento, Santolo Journal: Solar energy Issue: Volume 226(2021) Page Start: 1 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗