Author/Creator: Martineau, D. - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Martineau, D.

1. Identification and analysis of power substrates degradations subjected to severe aging tests. Issue 9 (August 2015)

Authors:: Woirgard, E.; Arabi, F.; Sabbah, W.; Martineau, D.; Theolier, L.; Azzopardi, S.
Journal:: Microelectronics and reliability
Issue:: Volume 55:Issue 9/10(2015)
Page Start:: 1961
Record Type:: Journal Article
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2. Pathologic Findings and Trends in Mortality in the Beluga (Delphinapterus leucas) Population of the St Lawrence Estuary, Quebec, Canada, From 1983 to 2012. (January 2016)

Authors:: Lair, S.; Measures, L. N.; Martineau, D.
Journal:: Veterinary pathology
Issue:: Volume 53:Number 1(2016:Jan.)
Page Start:: 22
Record Type:: Journal Article
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3. Power electronic assemblies: Thermo-mechanical degradations of gold-tin solder for attaching devices. (September 2016)

Authors:: Arabi, F.; Theolier, L.; Martineau, D.; Deletage, J.-Y.; Medina, M.; Woirgard, E.
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 409
Record Type:: Journal Article
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4. Power electronic assemblies: Thermo-mechanical degradations of gold-tin solder for attaching devices. (September 2016)

Authors:: Arabi, F.; Theolier, L.; Martineau, D.; Deletage, J.-Y.; Medina, M.; Woirgard, E.
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 409
Record Type:: Journal Article
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5. Power modules die attach: A comprehensive evolution of the nanosilver sintering physical properties versus its porosity. Issue 9 (August 2015)

Authors:: Youssef, T.; Rmili, W.; Woirgard, E.; Azzopardi, S.; Vivet, N.; Martineau, D.; Meuret, R.; Le Quilliec, G.; Richard, C.
Journal:: Microelectronics and reliability
Issue:: Volume 55:Issue 9/10(2015)
Page Start:: 1997
Record Type:: Journal Article
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6. Thermo-mechanical assessment of silver sintering for attaching power components in embedded PCB. (November 2020)

Authors:: Arabi, F.; Youssef, T.; Coudert, M.; Coquery, G.; Alayli, N.; Martineau, D.; Belnoue, O.
Journal:: Microelectronics and reliability
Issue:: Volume 114(2020)
Page Start:
Record Type:: Journal Article
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