1. Structural and emission properties of Tb3+-doped nitrogen-rich silicon oxynitride films. (17th February 2017) Authors: Labbé, C; An, Y-T; Zatryb, G; Portier, X; Podhorodecki, A; Marie, P; Frilay, C; Cardin, J; Gourbilleau, F Journal: Nanotechnology Issue: Volume 28:Number 11(2017) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗