1. Applications of Automated High Resolution Strain Mapping in TEM on the Study of Strain Distribution in MOSFETs. (August 2014) Authors: Darbal, A. D.; Narayan, R. D.; Vartuli, C.; Aoki, T.; Mardinly, J.; Nicolopoulos, S.; Weiss, J. K. Journal: Microscopy and microanalysis Issue: Volume 20(2014)Supplement 3 Page Start: 1066 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Applications of Automated High Resolution Strain Mapping in TEM on the Study of Strain Distribution in MOSFETs. (August 2014) Authors: Darbal, A. D.; Narayan, R. D.; Vartuli, C.; Aoki, T.; Mardinly, J.; Nicolopoulos, S.; Weiss, J. K. Journal: Microscopy and microanalysis Issue: Volume 20:Number 3(2014:Jun.) Page Start: 1066 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. High Energy and Spatial Resolution EELS Band Gap Measurements Using a Nion Monochromated Cold Field Emission HERMES Dedicated STEM. (August 2014) Authors: Carpenter, R.W; Xie, H.; Lehner, S.; Aoki, T.; Mardinly, J.; Vahidi, M.; Newman, N.; Ponce, F. A. Journal: Microscopy and microanalysis Issue: Volume 20(2014)Supplement 3 Page Start: 70 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. High Energy and Spatial Resolution EELS Band Gap Measurements Using a Nion Monochromated Cold Field Emission HERMES Dedicated STEM. (August 2014) Authors: Carpenter, R.W; Xie, H.; Lehner, S.; Aoki, T.; Mardinly, J.; Vahidi, M.; Newman, N.; Ponce, F. A. Journal: Microscopy and microanalysis Issue: Volume 20:Number 3(2014:Jun.) Page Start: 70 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗