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Author/Creator Marcon, Denis

1. Analysis of slow de-trapping phenomena after a positive gate bias on AlGaN/GaN MIS-HEMTs with in-situ Si3N4/Al2O3 bilayer gate dielectrics. (January 2015)

Authors:
Wu, Tian-Li; Marcon, Denis; Ronchi, Nicolo; Bakeroot, Benoit; You, Shuzhen; Stoffels, Steve; Van Hove, Marleen; Bisi, Davide; Meneghini, Matteo; Groeseneken, Guido; Decoutere, Stefaan
Journal:
Solid-state electronics
Issue:
Volume 103(2015)
Page Start:
127
Record Type:
Journal Article
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2. Comparison of AlGaN/GaN MISHEMT powerbar designs. Issue 3 (7th February 2014)

Authors:
Stoffels, Steve; Ronchi, Nicoló; Venegas, Rafael; De Jaeger, Brice; Marcon, Denis; Decoutere, Stefaan
Other Names:
Eddy, Jr. Charles R. "Chip" sponsoringEditor.; Kuball Martin sponsoringEditor.; Koleske Daniel D. sponsoringEditor.; Amano Hiroshi sponsoringEditor.
Journal:
Physica status solidi
Issue:
Volume 11:Issue 3/4(2014:Apr.)
Page Start:
906
Record Type:
Journal Article
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3. Study of the stability of e-mode GaN HEMTs with p-GaN gate based on combined DC and optical analysis. (September 2016)

Authors:
Rossetto, Isabella; Meneghini, Matteo; Rizzato, Vanessa; Ruzzarin, Maria; Favaron, Andrea; Stoffels, Steve; Van Hove, Marleen; Posthuma, Niels; Wu, Tian-Li; Marcon, Denis; Decoutere, Stefaan; Meneghesso, Gaudenzio; Zanoni, Enrico
Journal:
Microelectronics and reliability
Issue:
Volume 64(2016)
Page Start:
547
Record Type:
Journal Article
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4. Study of the stability of e-mode GaN HEMTs with p-GaN gate based on combined DC and optical analysis. (September 2016)

Authors:
Rossetto, Isabella; Meneghini, Matteo; Rizzato, Vanessa; Ruzzarin, Maria; Favaron, Andrea; Stoffels, Steve; Van Hove, Marleen; Posthuma, Niels; Wu, Tian-Li; Marcon, Denis; Decoutere, Stefaan; Meneghesso, Gaudenzio; Zanoni, Enrico
Journal:
Microelectronics and reliability
Issue:
Volume 64(2016)
Page Start:
547
Record Type:
Journal Article
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗

5. The 2018 GaN power electronics roadmap. (26th March 2018)

Authors:
Amano, H; Baines, Y; Beam, E; Borga, Matteo; Bouchet, T; Chalker, Paul R; Charles, M; Chen, Kevin J; Chowdhury, Nadim; Chu, Rongming; De Santi, Carlo; De Souza, Maria Merlyne; Decoutere, Stefaan; Di Cioccio, L; Eckardt, Bernd; Egawa, Takashi; Fay, P; Freedsman, Joseph J; Guido, L; Häberlen, Oliver
Journal:
Journal of physics
Issue:
Volume 51:Number 16(2018)
Page Start:
Record Type:
Journal Article
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Available online (eLD content is only available in our Reading Rooms) ↗