1. Postgrowth Control of the Interfacial Oxide Thickness in Semiconductor–Insulator–Semiconductor Heterojunctions. Issue 12 (18th April 2018) Authors: Maman, Nitzan; Templeman, Tzvi; Manis‐Levi, Hadar; Shandalov, Michael; Ezersky, Vladimir; Sarusi, Gabby; Golan, Yuval; Visoly‐Fisher, Iris Journal: Advanced materials interfaces Issue: Volume 5:Issue 12(2018) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗