1. Analytical characterisation of 3D nano scale ultra-thin film surrounding gate MOSFET. (6th June 2022) Authors: Agarwal, Aditya; Sharma, R.L.; Mani, Prashant Journal: International journal of engineering systems modelling and simulation Issue: Volume 13:Number 2(2022) Page Start: 134 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗