1. Optoelectronic properties of In2S3 thin films measured using surface photovoltage spectroscopy. (10th April 2019) Authors: Rasool, S; Saritha, K; Reddy, K T Ramakrishna; Bychto, L; Patryn, A; Maliński, M; Tivanov, M S; Gremenok, V F Journal: Materials research express Issue: Volume 6:Number 7(2019) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗