1. Detection and Localization of Defects in Monocrystalline Silicon Solar Cell. (30th May 2010) Authors: Tománek, P.; Škarvada, P.; Macků, R.; Grmela, L. Other Names: Polyanskii Peter V. Academic Editor. Journal: Advances in optical technologies Issue: Volume 2010(2010) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗