1. Extending XPS Surface Analysis with Correlative Spectroscopy and Microscopy. (August 2020) Authors: Nunney, Tim; Mack, Paul; Simpson, Robin; Passey, Rick; Oppong-Mensah, Helen; Baker, Mark Journal: Microscopy and microanalysis Issue: Volume 26:(2020)Supplement 2 Page Start: 1016 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Recent advances in dual mode charge compensation for XPS analysis. (25th June 2019) Authors: Edwards, Lee; Mack, Paul; Morgan, David J. Journal: Surface and interface analysis Issue: Volume 51:Number 9(2019) Page Start: 925 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. XPS Surface analysis augmented using correlative spectroscopy and microscopy. (August 2022) Authors: Nunney, Tim S; Mack, Paul; Oppong-Mensah, Helen; Baker, Mark; England, Jonathan Journal: Microscopy and microanalysis Issue: Volume 28(2022)Supplement 1 Page Start: 978 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗