Author/Creator: Ma, Y.Z. - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Ma, Y.Z.

1. Failure analysis on 14 nm FinFET devices with ESD CDM failure. (September 2018)

Authors:: Shaalini, C.; Tan, P.K.; Zhao, Y.Z.; Liu, B.H.; Ma, Y.Z.; Quah, A.; Pan, Y.L.; Tan, H.; Mai, Z.H.
Journal:: Microelectronics and reliability
Issue:: Volume 88/90(2018)
Page Start:: 321
Record Type:: Journal Article
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2. Comment on "Correlation analysis of element contents and mechanical characteristics of shale reservoirs" by Liu et al. (2018). (June 2020)

Authors:: Zhang, Ye; Ma, Y.Z.; Gomez, Ernest
Journal:: Marine and petroleum geology
Issue:: Volume 116(2020)
Page Start:
Record Type:: Journal Article
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3. Cross-sectional nanoprobing fault isolation technique on submicron devices. (September 2016)

Authors:: Tan, P.K.; Yap, H.H.; Chen, C.Q.; Rivai, F.; Zhao, Y.Z.; Zhu, L.; Feng, H.; Tan, H.; He, R.; Wang, D.D.; Huang, Y.M.; Ma, Y.Z.; Lam, J.; Mai, Z.H.
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 321
Record Type:: Journal Article
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4. Electrical analysis on implantation-related defect by nanoprobing methodology. (September 2016)

Authors:: Chen, C.Q.; Ng, P.T.; Ang, G.B.; T an, H.; Rivai, Francis; Ma, Y.Z.; Ng, H.P.; Lam, Jeffery; Mai, Z.H.
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 317
Record Type:: Journal Article
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5. The phase transformation and electrochemical properties of TiNi alloys with Cu substitution: Experiments and first-principle calculations. (12th January 2017)

Authors:: Zhang, Z.; Elkedim, O.; Ma, Y.Z.; Balcerzak, M.; Jurczyk, M.
Journal:: International journal of hydrogen energy
Issue:: Volume 42:Number 2(2017)
Page Start:: 1444
Record Type:: Journal Article
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6. Electrical analysis on implantation-related defect by nanoprobing methodology. (September 2016)

Authors:: Chen, C.Q.; Ng, P.T.; Ang, G.B.; T an, H.; Rivai, Francis; Ma, Y.Z.; Ng, H.P.; Lam, Jeffery; Mai, Z.H.
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 317
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

7. Cross-sectional nanoprobing fault isolation technique on submicron devices. (September 2016)

Authors:: Tan, P.K.; Yap, H.H.; Chen, C.Q.; Rivai, F.; Zhao, Y.Z.; Zhu, L.; Feng, H.; Tan, H.; He, R.; Wang, D.D.; Huang, Y.M.; Ma, Y.Z.; Lam, J.; Mai, Z.H.
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 321
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗