1. Electrical characterization and examination of temperature-induced degradation of metastable Ge0.81Sn0.19 nanowires. Issue 41 (12th October 2018) Authors: Sistani, M.; Seifner, M. S.; Bartmann, M. G.; Smoliner, J.; Lugstein, A.; Barth, S. Journal: Nanoscale Issue: Volume 10:Issue 41(2018) Page Start: 19443 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗