1. A High Rigidity and Precision Scanning Tunneling Microscope with Decoupled XY and Z Scans. (14th November 2017) Authors: Chen, Xu; Guo, Tengfei; Hou, Yubin; Zhang, Jing; Meng, Wenjie; Lu, Qingyou Other Names: Yoshimura Masamichi Academic Editor. Journal: Scanning Issue: Volume 2017(2017) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗