1. From Scintillator-based Detector to Direct Electron Detector: High Performance of Next Generation of Camera for In-situ TEM Testing and TEM Imaging. (23rd September 2015) Authors: Guo, Hua; Jin, Liang; Lu, Penghan; Wang, Zhangjie; Shan, Zhiwei; Bammes, Benjamin; Spilman, Michael; Bilhorn, Robert Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 343 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. From Scintillator-based Detector to Direct Electron Detector: High Performance of Next Generation of Camera for In-situ TEM Testing and TEM Imaging. (August 2015) Authors: Guo, Hua; Jin, Liang; Lu, Penghan; Wang, Zhangjie; Shan, Zhiwei; Bammes, Benjamin; Spilman, Michael; Bilhorn, Robert Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 343 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Pushing the limits in single particle cryo-EM: general discussion. (26th October 2022) Authors: Bakker, Saskia E.; Bhella, David; Brescia, Rosaria; Bullough, Per; Clare, Daniel K.; Daum, Bertram; Frank, René A. W.; Gold, Vicki A. M.; Jackson Hirst, Isobel; Kühlbrandt, Werner; Lu, Penghan; McLaren, Mathew; Menday, Rebbekah; Muench, Stephen P.; Rauschenbach, Stephan; Russo, Christopher J.; Sa... Journal: Faraday discussions Issue: Volume 240(2022) Page Start: 312 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗