1. Abnormal threshold voltage shift caused by trapped holes under hot-carrier stress in a-IGZO TFTs. (13th December 2019) Authors: Shao, Jingjing; Su, Wan-Ching; Chang, Ting-Chang; Chen, Hong-Chih; Zhou, Kuan-Ju; Lu, I-Nien; Tu, Yu-Fa; Shih, Yu-Shan; Tsai, Tsung-Ming; Lien, Chen-Hsin; Yang, Jianwen; Zhang, Qun Journal: Journal of physics Issue: Volume 53:Number 8(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗