1. Automated detector simulation and reconstruction parametrization using machine learning. (29th May 2020) Authors: Benjamin, D.; Chekanov, S.; Hopkins, W.; Li, Y.; Love, J.R. Journal: Journal of instrumentation Issue: Volume 15:Number 5(2020) Page Start: P05025 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗