1. Nano-characterisation of dielectric breakdown in the various advanced gate stack MOSFETs. (6th June 2007) Authors: Pey, K.L.; Tung, C.H.; Ranjan, R.; Lo, V.L.; MacKenzie, M.; Craven, A.J. Journal: International journal of nanotechnology Issue: Volume 4:Number 4(2007) Page Start: 347 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗