1. AmaLgam+: Composing Rich Information Sources for Accurate Bug Localization. Issue 10 (10th October 2016) Authors: Wang, Shaowei; Lo, David Other Names: Roy Chanchal K. guestEditor.; Begel Andrew guestEditor.; Moonen Leon guestEditor. Journal: Journal of software Issue: Volume 28:Issue 10(2016) Page Start: 921 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Dual analysis for recommending developers to resolve bugs. Issue 3 (3rd March 2015) Authors: Xia, Xin; Lo, David; Wang, Xinyu; Zhou, Bo Journal: Journal of software Issue: Volume 27:Issue 3(2015:Mar.) Page Start: 195 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Extended comprehensive study of association measures for fault localization‡. Issue 2 (29th August 2013) Authors: Lucia, Lucia; Lo, David; Jiang, Lingxiao; Thung, Ferdian; Budi, Aditya Journal: Journal of software Issue: Volume 26:Issue 2(2014:Feb.) Page Start: 172 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Guest editor's introduction to the Special Issue on Source Code Analysis and Manipulation (SCAM 2015). Issue 12 (14th December 2017) Authors: Khomh, Foutse; Lo, David; Godfrey, Michael W. Other Names: Khomh Foutse guestEditor.; Lo David guestEditor.; Godfrey Michael W. guestEditor. Journal: Journal of software Issue: Volume 29:Issue 12(2017) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗