1. Nonlinear characteristics in fracture strength test of ultrathin silicon die. (11th March 2015) Authors: Liu, Zunxu; Huang, YongAn; Xiao, Lin; Tang, Pengpeng; Yin, Zhouping Journal: Semiconductor science and technology Issue: Volume 30:Number 4(2015:Apr.) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Nonlinear characteristics in fracture strength test of ultrathin silicon die. (April 2015) Authors: Liu, Zunxu; Huang, YongAn; Xiao, Lin; Tang, Pengpeng; Yin, Zhouping Journal: Semiconductor science and technology Issue: Volume 30:Number 4(2015:Apr.) Page Start: 1603 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗