Author/Creator: Liu, Jingcun - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Liu, Jingcun

1. (Invited) Ruggedness of SiC and GaN Power Transistors in Switching Based Tests. (8th September 2020)

Authors:: Zhang, Ruizhe; Kozak, Joseph; Liu, Jingcun; Zhang, Yuhao
Journal:: ECS transactions
Issue:: Volume 98:Number 6(2020)
Page Start:: 37
Record Type:: Journal Article
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2. IGBT aging monitoring and remaining lifetime prediction based on long short-term memory (LSTM) networks. (November 2020)

Authors:: Li, Wanping; Wang, Bixuan; Liu, Jingcun; Zhang, Guogang; Wang, Jianhua
Journal:: Microelectronics and reliability
Issue:: Volume 114(2020)
Page Start:
Record Type:: Journal Article
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3. Multiple failure mode identification of SiC planar MOSFETs in short-circuit operation. (November 2020)

Authors:: Wang, Bixuan; Liu, Jingcun; Li, Wanping; Zhang, Guogang; Geng, Yingsan; Wang, Jianhua
Journal:: Microelectronics and reliability
Issue:: Volume 114(2020)
Page Start:
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗