1. Quantitative STEM Imaging and Multislice Simulation of Stacking Fault Defects for Exciton Trapping in GaAs. (August 2020) Authors: Spurgeon, Steven; Matthews, Bethany; Sushko, Peter; Linpeng, Xiayu; Viitaniemi, Maria; Durnev, Mikhail; Glazov, Mikhail; Wieck, Andreas; Ludwig, Arne; Fu, Kai-Mei Journal: Microscopy and microanalysis Issue: Volume 26:(2020)Supplement 2 Page Start: 2822 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗