1. Abnormal threshold voltage shift caused by trapped holes under hot-carrier stress in a-IGZO TFTs. (13th December 2019) Authors: Shao, Jingjing; Su, Wan-Ching; Chang, Ting-Chang; Chen, Hong-Chih; Zhou, Kuan-Ju; Lu, I-Nien; Tu, Yu-Fa; Shih, Yu-Shan; Tsai, Tsung-Ming; Lien, Chen-Hsin; Yang, Jianwen; Zhang, Qun Journal: Journal of physics Issue: Volume 53:Number 8(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Analysis of self-heating-related instability in n-channel low-temperature polysilicon TFTs with different S/D contact hole densities. (1st March 2022) Authors: Tu, Yu-Fa; Chang, Ting-Chang; Zhou, Kuan-Ju; Hung, Yang-Hao; Zheng, Yu-Zhe; Chen, Jian-Jie; Tai, Mao-Chou; Wang, Yu-Xuan; Hung, Wei-Chun; Hung, Wei-Chieh; Lien, Chen-Hsin Journal: Applied physics express Issue: Volume 15:Number 3(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Clarifying the switching layer transformation through analysis of an abnormal I–V curves with increasing set compliance current in oxide-based resistive random access memory. (2nd September 2021) Authors: Lin, Shih-Kai; Chang, Ting-Chang; Lien, Chen-Hsin; Wu, Cheng-Hsien; Xu, You-Lin; Yang, Chih-Cheng; Huang, Wei-Chen; Wu, Pei-Yu; Zhang, Yong-Ci; Chou, Sheng-Yao; Huang, Hui-Chun; Wang, Kao-Yuan; Sze, Simon M. Journal: Applied physics express Issue: Volume 14:Number 9(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Device operation and physical mechanism of asymmetric junctionless tunnel field-effect transistors designed to suppress coupled short-channel/short-drain effects and promote on-current switching for ultralow-voltage CMOS applications. (1st June 2022) Authors: Chen, Yu-Hsuan; Teng, Hung-Jin; Lien, Chen-Hsin; Shih, Chun-Hsing Journal: Semiconductor science and technology Issue: Volume 37:Number 6(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Evaluating the CDM-Robustness of the input buffer with very fast transmission line pulse. (February 2015) Authors: Kao, Tzu-Cheng; Lee, Jian-Hsing; Hung, Chung-Yu; Lien, Chen-Hsin; Su, Hung-Der Journal: Solid-state electronics Issue: Volume 104(2015) Page Start: 12 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Inverse paired-pulse facilitation in neuroplasticity based on interface-boosted charge trapping layered electronics. (November 2020) Authors: Lee, Ko-Chun; Li, Mengjiao; Chang, Yu-Hsiang; Yang, Shih-Hsien; Lin, Che-Yi; Chang, Yuan-Ming; Yang, Feng-Shou; Watanabe, Kenji; Taniguchi, Takashi; Ho, Ching-Hwa; Lien, Chen-Hsin; Lin, Shu-Ping; Chiu, Po-Wen; Lin, Yen-Fu Journal: Nano energy Issue: Volume 77(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Multifunctional full-visible-spectrum optoelectronics based on a van der Waals heterostructure. (December 2019) Authors: Yang, Shih-Hsien; Lee, Ko-Chun; Tsai, Meng-Yu; Chang, Yuan-Ming; Lin, Che-Yi; Yang, Feng-Shou; Watanabe, Kenji; Taniguchi, Takashi; Lien, Chen-Hsin; Ho, Ching-Hwa; Li, Mengjiao; Lin, Yen-Fu; Lai, Ying-Chih Journal: Nano energy Issue: Volume 66(2019) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Use of a supercritical fluid treatment to improve switching region in resistive random access memory. (1st June 2022) Authors: Lin, Shih-Kai; Chen, Min-Chen; Chang, Ting-Chang; Lien, Chen-Hsin; Wu, Cheng-Hsien; Lin, Yu-Shuo; Wu, Pei-Yu; Tan, Yung-Fang; Huang, Wei-Chen; Zhang, Yong-Ci; Chou, Sheng-Yao; Wu, Chung-Wei; Sze, Simon M. Journal: Applied physics express Issue: Volume 15:Number 6(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗