1. Critical impact of gate dielectric interfaces on the trap states and cumulative charge of high-performance organic thin field transistors. (1st March 2019) Authors: Lin, Hui; Zhao, Wenqiang; Kong, Xiao; Li, Lijuan; Li, Yimeng; Kuang, Peng; Zhang, Yi; Zhang, Landan; Sun, Ming; Tao, Silu Journal: Materials science in semiconductor processing Issue: Volume 91(2019) Page Start: 275 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗