Author/Creator: Li, M.X. / Journal: Microelectronics and reliability - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Li, M.X. Journal Microelectronics and reliability

1. Degradation behavior and mechanism of polymer films for high-ohmic resistor protection in a heat and humid environment. (February 2016)

Authors:: Wang, X.Y.; Zhang, H.; Ma, X.P.; Cheng, Q.; Li, C.G.; Li, M.X.; Chen, T.N.; Zhang, P.; Shao, J.Q.
Journal:: Microelectronics and reliability
Issue:: Volume 57(2016)
Page Start:: 79
Record Type:: Journal Article
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2. Improvement of reliability for high-ohmic Cr–Si thin film resistors in a heat and humid environment: Removing moisture source by electrocatalytic decomposition of water. (May 2016)

Authors:: Wang, X.Y.; Cheng, Q.; Ma, X.P.; Zhang, H.; Li, M.X.; Chen, T.N.; Zhang, P.; Shao, J.Q.
Journal:: Microelectronics and reliability
Issue:: Volume 60(2016)
Page Start:: 101
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

3. Improvement of reliability for high-ohmic Cr–Si thin film resistors in a heat and humid environment: Removing moisture source by electrocatalytic decomposition of water. (May 2016)

Authors:: Wang, X.Y.; Cheng, Q.; Ma, X.P.; Zhang, H.; Li, M.X.; Chen, T.N.; Zhang, P.; Shao, J.Q.
Journal:: Microelectronics and reliability
Issue:: Volume 60(2016)
Page Start:: 101
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗