Author/Creator: Lewitschnig, Horst - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Lewitschnig, Horst

1. Advanced Bayesian Estimation of Weibull Early Life Failure Distributions. (8th January 2014)

Authors:: Kurz, Daniel; Lewitschnig, Horst; Pilz, Jürgen; Goos, Peter; De Ketelaere, Bart
Journal:: Quality and reliability engineering international
Issue:: Volume 30:Number 3(2014:Apr.)
Page Start:: 363
Record Type:: Journal Article
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2. An advanced area scaling approach for semiconductor burn-in. Issue 1 (January 2015)

Authors:: Kurz, Daniel; Lewitschnig, Horst; Pilz, Jürgen
Journal:: Microelectronics and reliability
Issue:: Volume 55:Issue 1(2015)
Page Start:: 129
Record Type:: Journal Article
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3. Determination of tolerance limits for the reliability of semiconductor devices using longitudinal data. (30th October 2017)

Authors:: Hofer, Vera; Leitner, Johannes; Lewitschnig, Horst; Nowak, Thomas
Journal:: Quality and reliability engineering international
Issue:: Volume 33:Number 8(2017:Dec.)
Page Start:: 2673
Record Type:: Journal Article
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4. Failure probability estimation with differently sized reference products for semiconductor burn‐in studies. (19th December 2014)

Authors:: Kurz, Daniel; Lewitschnig, Horst; Pilz, Jürgen
Journal:: Applied stochastic models in business and industry
Issue:: Volume 31:Number 5(2015:Sep./Oct.)
Page Start:: 732
Record Type:: Journal Article
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5. Flexible time reduction method for burn‐in of high‐quality products. (30th April 2021)

Authors:: Kurz, Daniel; Lewitschnig, Horst; Pilz, Juergen
Journal:: Quality and reliability engineering international
Issue:: Volume 37:Number 6(2021)
Page Start:: 2900
Record Type:: Journal Article
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6. Quality control of lifetime drift effects. (December 2022)

Authors:: Lewitschnig, Horst; Sommeregger, Lukas
Journal:: Microelectronics and reliability
Issue:: Volume 139(2022)
Page Start:
Record Type:: Journal Article
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7. Spline‐Based Drift Analysis for the Reliability of Semiconductor Devices. Issue 8 (10th July 2021)

Authors:: Hofer, Vera; Nowak, Thomas; Lewitschnig, Horst
Journal:: Advanced theory and simulations
Issue:: Volume 4:Issue 8(2021)
Page Start:: n/a
Record Type:: Journal Article
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