1. Quantitative evaluation of microtwins and antiphase defects in GaP/Si nanolayers for a III–V photonics platform on silicon using a laboratory X‐ray diffraction setup. (1st June 2015) Authors: Ping Wang, Yan; Letoublon, Antoine; Nguyen Thanh, Tra; Bahri, Mounib; Largeau, Ludovic; Patriarche, Gilles; Cornet, Charles; Bertru, Nicolas; Le Corre, Alain; Durand, Olivier Journal: Journal of applied crystallography Issue: Volume 48:Part 3(2015:Jun.) Page Start: 702 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗