1. Grain boundary light beam induced current: A characterization of bonded silicon wafers and polycrystalline silicon thin films for diffusion length extraction. Issue 7 (13th April 2016) Authors: Gref, Orman; Teodoreanu, Ana‐Maria; Leihkauf, Rainer; Lohrke, Heiko; Kittler, Martin; Amkreutz, Daniel; Boit, Christian; Friedrich, Felice Journal: Physica status solidi Issue: Volume 213:Issue 7(2016:Jul.) Page Start: 1728 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗