1. Electrical characterization of defects introduced during sputter deposition of tungsten on n type 4H-SiC. (July 2018) Authors: Tunhuma, Shandirai M.; Auret, F.D.; Legodi, M.J.; Nel, J.; Diale, M. Journal: Materials science in semiconductor processing Issue: Volume 81(2018) Page Start: 122 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗