1. Dopant activity for highly in-situ doped polycrystalline silicon: hall, XRD, scanning capacitance microscopy (SCM) and scanning spreading resistance microscopy (SSRM). (18th March 2021) Authors: Coq Germanicus, Rosine; Lallemand, Florent; Chateigner, Daniel; Jouha, Wadia; Moultif, Niemat; Latry, Olivier; Fouchet, Arnaud; Murray, Hugues; Bunel, Catherine; Lüders, Ulrike Journal: Nano express Issue: Volume 2:Number 1(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Estimation of losses of GaN HEMT in power switching applications based on experimental characterization. (June 2020) Authors: Bouchour, Al Mehdi; Oualkadi, Ahmed El; Latry, Olivier; Dherbécourt, Pascal; Echeverri, Andrés Journal: Computers & electrical engineering Issue: Volume 84(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Failure investigation of packaged SiC-diodes after thermal storage in extreme operating condition. (January 2018) Authors: Latry, Olivier; Dherbecourt, Pascal; Denis, Patrick; Cuvilly, Fabien; Kadi, Moncef Journal: Engineering failure analysis Issue: Volume 83(2018) Page Start: 185 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Localizing and analyzing defects in AlGaN/GaN HEMT using photon emission spectral signatures. (November 2017) Authors: Moultif, Niemat; Divay, Alexis; Joubert, Eric; Latry, Olivier Journal: Engineering failure analysis Issue: Volume 81(2017) Page Start: 69 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Optimizing Atom Probe Analysis with Synchronous Laser Pulsing and Voltage Pulsing. (8th February 2017) Authors: Zhao, Lu; Normand, Antoine; Houard, Jonathan; Blum, Ivan; Delaroche, Fabien; Latry, Olivier; Ravelo, Blaise; Vurpillot, Francois Editors: Thuvander, Mattias; Cairney, Julie; Gerstl, Stephan Journal: Microscopy and microanalysis Issue: Volume 23:Number 2(2017) Page Start: 221 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗