1. Model Order Selection for Short Data: An Exponential Fitting Test (EFT). (4th October 2006) Authors: Quinlan Quinlan, Angela Angela; Barbot Barbot, Jean-Pierre Jean-Pierre; Larzabal Larzabal, Pascal Pascal; Haardt Haardt, Martin Martin Other Names: Champagne Champagne Benoit Benoit Academic Editor. Journal: EURASIP journal on advances in signal processing Issue: Volume 2007(2007) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗