1. Correlative Analysis in the Semiconductor Industry. (August 2019) Authors: Larson, DJ; Prosa, TJ; Martin, I; Robbes, A-S; Merkulov, A; Bernier, N; Delaye, V; van der Heide, P; Dulac, O; Reinhard, DA; Ulfig, RM Journal: Microscopy and microanalysis Issue: Volume 25:(2022)Supplement 2 Page Start: 2502 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Reconstruction Metrics in Atom Probe Tomography. (August 2019) Authors: Geiser, BP; Reinhard, DA; Bunton, JH; Payne, TR; Rice, KP; Chen, Y; Larson, DJ Journal: Microscopy and microanalysis Issue: Volume 25:(2022)Supplement 2 Page Start: 336 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗