Author/Creator: Lai, LiLung - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Lai, LiLung

1. Applications of the pulsed current-voltage (I-V) and capacitance-voltage (C-V) techniques for high-resistive gates in MOSFETs. (August 2016)

Authors:: Lai, LiLung; Wu, Xiaojing
Journal:: Microelectronics and reliability
Issue:: Volume 63(2016)
Page Start:: 22
Record Type:: Journal Article
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2. Applications of the pulsed current-voltage (I-V) and capacitance-voltage (C-V) techniques for high-resistive gates in MOSFETs. (August 2016)

Authors:: Lai, LiLung; Wu, Xiaojing
Journal:: Microelectronics and reliability
Issue:: Volume 63(2016)
Page Start:: 22
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

3. The device characteristics of missing LDD implantation via nanoprobing techniques for localized failure analysis. Issue 8 (July 2015)

Authors:: Lai, LiLung; Wu, Xiaojing
Journal:: Microelectronics and reliability
Issue:: Volume 55:Issue 8(2015)
Page Start:: 1144
Record Type:: Journal Article
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4. The Strategy of Advanced Analysis in Semiconductor Nano-Device: From Nanoprobing to Nanoscopy and Nanoanalysis. (August 2014)

Authors:: Lai, LiLung
Journal:: Microscopy and microanalysis
Issue:: Volume 20(2014)Supplement 3
Page Start:: 980
Record Type:: Journal Article
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5. The Strategy of Advanced Analysis in Semiconductor Nano-Device: From Nanoprobing to Nanoscopy and Nanoanalysis. (August 2014)

Authors:: Lai, LiLung
Journal:: Microscopy and microanalysis
Issue:: Volume 20:Number 3(2014:Jun.)
Page Start:: 980
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗