1. Electrically Active Defects in Plated Crystalline Silicon n+p Solar Cells: A DLTS Perspective. (23rd July 2018) Authors: Simoen, Eddy Roger; Dang, Chi; Labie, Riet; Poortmans, Jef Journal: ECS transactions Issue: Volume 86:Number 10(2018) Page Start: 137 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Four-point bending cycling: The alternative for thermal cycling solder fatigue testing of electronic components. (July 2017) Authors: Vandevelde, Bart; Vanhee, Filip; Pissoort, Davy; Degrendele, Lieven; De Baets, Johan; Allaert, Bart; Lauwaert, Ralph; Zanon, Franco; Labie, Riet; Willems, Geert Journal: Microelectronics and reliability Issue: Volume 74(2017) Page Start: 131 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Insights into the reliability of Ni/Cu plated p-PERC silicon solar cells. (September 2017) Authors: Dang, Chi; Labie, Riet; Simoen, Eddy; Tous, Loic; Russell, Richard; Duerinckx, Filip; Mertens, Robert; Poortmans, Jef Journal: Energy procedia Issue: Volume 124(2017) Page Start: 862 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗