Author/Creator: Kuzmik, J. - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Kuzmik, J.

1. Bandgap, electrical and structural properties of thick InN (0001) films grown under optimal conditions. (May 2019)

Authors:: Adikimenakis, A.; Androulidaki, M.; Foundoulaki Salhin, E.; Tsagaraki, K.; Doundoulakis, G.; Kuzmik, J.; Georgakilas, A.
Journal:: Journal of physics
Issue:: Volume 1190(2019)
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Record Type:: Journal Article
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2. Correlation of Threading Dislocations with the Electron Concentration and Mobility in InN Heteroepitaxial Layers Grown by MBE. (11th October 2019)

Authors:: Adikimenakis, A.; Chatzopoulou, P.; Dimitrakopulos, G. P.; Kehagias, Th.; Tsagaraki, K.; Androulidaki, M.; Doundoulakis, G.; Kuzmik, J.; Georgakilas, A.
Journal:: ECS journal of solid state science and technology
Issue:: Volume 9:Number 1(2020)
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Record Type:: Journal Article
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3. Correlation of Threading Dislocations with the Electron Concentration and Mobility in InN Heteroepitaxial Layers Grown by MBE. (1st January 2020)

Authors:: Adikimenakis, A.; Chatzopoulou, P.; Dimitrakopulos, G. P.; Kehagias, Th.; Tsagaraki, K.; Androulidaki, M.; Doundoulakis, G.; Kuzmik, J.; Georgakilas, A.
Journal:: ECS journal of solid state science and technology
Issue:: Volume 9:Number 1(2020)
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Record Type:: Journal Article
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4. High resolution physical analysis of ohmic contact formation at GaN-HEMT devices. (September 2017)

Authors:: Graff, A.; Simon-Najasek, M.; Altmann, F.; Kuzmik, J.; Gregušová, D.; Haščík, Š.; Jung, H.; Baur, T.; Grünenpütt, J.; Blanck, H.
Journal:: Microelectronics and reliability
Issue:: Volume 76/77(2017)
Page Start:: 338
Record Type:: Journal Article
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5. Semi-insulating GaN for vertical structures: role of substrate selection and growth pressure. (1st November 2020)

Authors:: Šichman, P.; Hasenöhrl, S.; Stoklas, R.; Priesol, J.; Dobročka, E.; Haščík, Š.; Gucmann, F.; Vincze, A.; Chvála, A.; Marek, J.; Šatka, A.; Kuzmik, J.
Journal:: Materials science in semiconductor processing
Issue:: Volume 118(2020)
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Record Type:: Journal Article
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