1. On the permanent component profiling of the negative bias temperature instability in p-MOSFET devices. (April 2015) Authors: Djezzar, Boualem; Tahi, Hakim; Benabdelmoumene, Abdelmadjid; Chenouf, Amel; Goudjil, Mohamed; Kribes, Youcef Journal: Solid-state electronics Issue: Volume 106(2015) Page Start: 54 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗