1. Ultra high spatial resolution SIMS with cluster ions — approaching the physical limits. (6th July 2012) Authors: Kollmer, Felix; Paul, Wolfgang; Krehl, Martin; Niehuis, Ewald Journal: Surface and interface analysis Issue: Volume 45:Number 1(2013:Jan.) Page Start: 312 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗