1. Exploring Low-dimensional Carbon Materials by High-resolution Electron and Scanned Probe Microscopy. (23rd September 2015) Authors: Meyer, Jannik C.; Kotakoski, Jani; Argentero, Giacomo; Mangier, Clemens; Bayer, Bernhard; Kramberger-Kaplan, Christian; Eder, Franz; Hummel, Stefan; Elibol, Kenan; Mittelberger, Andreas Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 1147 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Exploring Low-dimensional Carbon Materials by High-resolution Electron and Scanned Probe Microscopy. (August 2015) Authors: Meyer, Jannik C.; Kotakoski, Jani; Argentero, Giacomo; Mangier, Clemens; Bayer, Bernhard; Kramberger-Kaplan, Christian; Eder, Franz; Hummel, Stefan; Elibol, Kenan; Mittelberger, Andreas Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 1147 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗