Author/Creator: Kopanski, Joseph J. - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Kopanski, Joseph J.

1. (Invited) Characterization of Buried Interfaces with Scanning Probe Microscopes. (26th April 2016)

Authors:: Kopanski, Joseph J.; You, Lin; Li, Jennifer; Ahn, Jung Joon; Obeng, Yaw S.
Journal:: ECS transactions
Issue:: Volume 72:Number 2(2016)
Page Start:: 131
Record Type:: Journal Article
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2. Broadband Spectroscopic Characterization of Hybrid Low-k Dielectric Thin Films for Micro- and Nanoelectronic Applications. (19th August 2016)

Authors:: Obeng, Yaw S.; Okoro, Chukwudi A.; Montgomery, Karl R.; Amoah, Papa K.; You, Lin; Kopanski, Joseph J.; Obrzut, Jan
Journal:: ECS transactions
Issue:: Volume 75:Number 5(2016)
Page Start:: 199
Record Type:: Journal Article
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3. Dielectric Spectroscopic Detection of Early Failures in 3-D Integrated Circuits. (10th September 2015)

Authors:: Obeng, Yaw S.; Okoro, Chukwudi A.; Ahn, Jung-Joon; You, Lin; Kopanski, Joseph J.
Journal:: ECS transactions
Issue:: Volume 69:Number 6(2015)
Page Start:: 69
Record Type:: Journal Article
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