1. Fast microwave calibration system for cryogenic device characterization. (1st November 2022) Authors: Chen, Yong; Duan, Peng; Jia, Zhi-long; Yang, Xin-xin; Zhang, Chi; Kong, Wei-cheng; Li, Hai-Ou; Cao, Gang; Guo, Guo-Ping Journal: Journal of instrumentation Issue: Volume 17:Number 11(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗