1. Change in the defect structure of composition controlled single-phase YbFe2O4 epitaxial thin films. (10th August 2020) Authors: Shimamoto, K.; Tanaka, J.; Miura, K.; Kiriya, D.; Yoshimura, T.; Fujimura, N. Journal: Japanese journal of applied physics Issue: Volume 59:Number SP(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Fabrication of chemical composition controlled YbFe2O4 epitaxial thin films. (27th August 2019) Authors: Tanaka, J.; Miura, K.; Kiriya, D.; Yoshimura, T.; Ashida, A.; Fujimura, N. Journal: Japanese journal of applied physics Issue: Volume 58:Number SL(2019) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗