1. Mechanically flexible nanoscale silicon integrated circuits powered by photovoltaic energy harvesters. (March 2016) Authors: Shahrjerdi, D.; Bedell, S.W.; Khakifirooz, A.; Cheng, K. Journal: Solid-state electronics Issue: Volume 117(2016) Page Start: 117 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Mechanically flexible nanoscale silicon integrated circuits powered by photovoltaic energy harvesters. (March 2016) Authors: Shahrjerdi, D.; Bedell, S.W.; Khakifirooz, A.; Cheng, K. Journal: Solid-state electronics Issue: Volume 117(2016) Page Start: 117 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Strain Quantification Analysis of Epitaxial SiGe on SOI by Nanobeam Diffraction (NBD). (August 2014) Authors: Li, J.; Cheng, K.; Khakifirooz, A.; Wang, J.; Reznicek, A.; Madan, A.; Dons, B.; Loubet, N.; He, H.; Gaudiello, J. Journal: Microscopy and microanalysis Issue: Volume 20(2014)Supplement 3 Page Start: 1070 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Strain Quantification Analysis of Epitaxial SiGe on SOI by Nanobeam Diffraction (NBD). (August 2014) Authors: Li, J.; Cheng, K.; Khakifirooz, A.; Wang, J.; Reznicek, A.; Madan, A.; Dons, B.; Loubet, N.; He, H.; Gaudiello, J. Journal: Microscopy and microanalysis Issue: Volume 20:Number 3(2014:Jun.) Page Start: 1070 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Strain scaling for CMOS. (12th February 2014) Authors: Bedell, S.W.; Khakifirooz, A.; Sadana, D.K. Journal: MRS bulletin Issue: Volume 39:Number 2(2014:Feb.) Page Start: 131 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Strain scaling for CMOS. (12th February 2014) Authors: Bedell, S.W.; Khakifirooz, A.; Sadana, D.K. Journal: MRS bulletin Issue: Volume 39:Number 2(2014:Feb.) Page Start: 131 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Strain scaling for CMOS. (12th February 2014) Authors: Bedell, S.W.; Khakifirooz, A.; Sadana, D.K. Journal: MRS bulletin Issue: Volume 39:Number 2(2014:Feb.) Page Start: 131 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗