1. Atom-by-Atom STEM Investigation of Defect Engineering in Graphene. (August 2014) Authors: Ramasse, Q.M.; Kepapstoglou, D.M.; Hage, F.S.; Susi, T.; Kotakoski, J.; Mangler, C.; Ayala, P.; Meyer, J.; Hinks, J.A.; Donnelly, S.; Zan, R.; Pan, C.T.; Haigh, S.J.; Bangert, U. Journal: Microscopy and microanalysis Issue: Volume 20(2014)Supplement 3 Page Start: 1736 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Atom-by-Atom STEM Investigation of Defect Engineering in Graphene. (August 2014) Authors: Ramasse, Q.M.; Kepapstoglou, D.M.; Hage, F.S.; Susi, T.; Kotakoski, J.; Mangler, C.; Ayala, P.; Meyer, J.; Hinks, J.A.; Donnelly, S.; Zan, R.; Pan, C.T.; Haigh, S.J.; Bangert, U. Journal: Microscopy and microanalysis Issue: Volume 20:Number 3(2014:Jun.) Page Start: 1736 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗