1. Depth profiling of very thin HfO2/Al2O3 stacks by ellipsometry. Issue 1 (1st March 2022) Authors: Karmakov, Y; Paskaleva, A; Spassov, D Journal: Journal of physics Issue: Volume 2240:Issue 1(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Interfaces in ALD very thin Al2O3/HfO2 stacks studied by ellipsometry. Issue 1 (1st January 2023) Authors: Karmakov, Y; Paskaleva, A; Spassov, D Journal: Journal of physics Issue: Volume 2436 Issue 1(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗