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Author/Creator Karcher, Timothy

3. Understanding gaas Native Oxides By Correlating Three Liquid Contact Angle Analysis (3LCAA) and High Resolution Ion Beam Analysis (HR-IBA) to X-Ray Photoelectron Spectroscopy (XPS) as Function of Surface Processing. (2019)

Authors:
Ram, Sukesh; Chow, Amber A.; Khanna, Shaurya; Suresh, Nikhil C.; Ark, Franscesca J.; Narayan, Saaketh R.; Gurijala, Aashi R.; Day, Jack M.; Karcher, Timothy; Culbertson, Robert J.; Whaley, Shawn D.; Kavanagh, Karen L.; Herbots, Nicole
Journal:
MRS advances
Issue:
Volume 4:Number 41/42(2019)
Page Start:
2249
Record Type:
Journal Article
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗

4. Understanding GaAs Native Oxides By Correlating Three Liquid Contact Angle Analysis (3LCAA) and High Resolution Ion Beam Analysis (HR-IBA) to X-Ray Photoelectron Spectroscopy (XPS) as Function of Surface Processing — ERRATUM. (2019)

Authors:
Ram, Sukesh; Chow, Amber A.; Khanna, Shaurya; Suresh, Nikhil C.; Ark, Franscesca J.; Narayan, Saaketh R.; Gurijala, Aashi R.; Day, Jack M.; Karcher, Timothy; Culbertson, Robert J.; Whaley, Shawn D.; Kavanagh, Karen L.; Herbots, Nicole
Journal:
MRS advances
Issue:
Volume 4:Number 41/42(2019)
Page Start:
2307
Record Type:
Journal Article
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗

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