1. Circuit Manufacturing Defect Detection Using VGG16 Convolutional Neural Networks. (16th April 2022) Authors: Althubiti, Sara A.; Alenezi, Fayadh; Shitharth, S.; K., Sangeetha; Reddy, Chennareddy Vijay Simha Other Names: Lakshmanna Kuruva Academic Editor. Journal: Wireless communications and mobile computing Issue: Volume 2022(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗