1. Impacts of Atom Probe Tomography on the Electronic and Photonic Device Technology. (August 2014) Authors: Park, C. G.; Lee, J.H.; Jang, D.H.; Jung, W.Y.; Park, S. M. Journal: Microscopy and microanalysis Issue: Volume 20(2014)Supplement 3 Page Start: 2172 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Impacts of Atom Probe Tomography on the Electronic and Photonic Device Technology. (August 2014) Authors: Park, C. G.; Lee, J.H.; Jang, D.H.; Jung, W.Y.; Park, S. M. Journal: Microscopy and microanalysis Issue: Volume 20:Number 3(2014:Jun.) Page Start: 2172 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗