Author/Creator: Juan, P.C. - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Juan, P.C.

1. Ferroelectric of HfO2 dielectric layer sputtered with TiN or ZrN for sandwich-like metal-insulator-metal capacitors. (April 2018)

Authors:: Juan, P.C.; Lin, K.C.; Chu, H.Y.; Kuo, Y.C.; Wang, H.W.; Shih, T.Y.
Journal:: Microelectronics and reliability
Issue:: Volume 83(2018)
Page Start:: 242
Record Type:: Journal Article
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2. Impact of stress induced by stressors on hot carrier reliability of strained nMOSFETs. (17th March 2014)

Authors:: Lin, K.C.; Twu, M.J.; Juan, P.C.; Hsu, H.W.; Huang, H.S.; Wang, M.C.; Liu, C.H.
Journal:: International journal of nanotechnology
Issue:: Volume 11:Number 1/2/3/4(2014)
Page Start:: 27
Record Type:: Journal Article
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3. Leakage current mechanism and effect of Y2O3 doped with Zr high-K gate dielectrics. Issue 11 (November 2015)

Authors:: Lin, K.C.; Juan, P.C.; Liu, C.H.; Wang, M.C.; Chou, C.H.
Journal:: Microelectronics and reliability
Issue:: Volume 55:Issue 11(2015)
Page Start:: 2198
Record Type:: Journal Article
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