1. Correlative SEM and Raman imaging of hot spots on SERS substrate. (23rd September 2015) Authors: Vana, R.; Kocman, M.; Jiruse, J. Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 153 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Correlative SEM and Raman imaging of hot spots on SERS substrate. (August 2015) Authors: Vana, R.; Kocman, M.; Jiruse, J. Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 153 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. FIB‐SIMS quantification using TOF‐SIMS with Ar and Xe plasma sources. (21st March 2014) Authors: Stevie, F. A.; Sedlacek, L.; Babor, P.; Jiruse, J.; Principe, E.; Klosova, K.; Lee, Yeonhee; Moon, DaeWon; Kang, Hee Jae; Kim, Kyung Joong; Lee, Tae Geol; Lee, Jae Cheol; Yi, Keewook; Hong, Tae Eun Journal: Surface and interface analysis Issue: Volume 46:Number 1(2014:Jan.) Page Start: 285 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Low Energy BSE Imaging with a New Scintillation Detector. (23rd September 2015) Authors: Kolosova, J.; Jiruse, J.; Fiala, J.; Beranek, J. Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 703 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Low Energy BSE Imaging with a New Scintillation Detector. (August 2015) Authors: Kolosova, J.; Jiruse, J.; Fiala, J.; Beranek, J. Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 703 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Xe Plasma FIB-SEM with Improved Resolution of Both Ion and Electron Columns. (23rd September 2015) Authors: Jiruse, J.; Havelka, M.; Polster, J.; Hrncif, T. Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 1995 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Xe Plasma FIB-SEM with Improved Resolution of Both Ion and Electron Columns. (August 2015) Authors: Jiruse, J.; Havelka, M.; Polster, J.; Hrncif, T. Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 1995 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗