1. Origin of Oxygen-Induced Abnormal Hump in Bottom-Gated Polycrystalline Zinc Oxide Thin Film Transistors. (13th February 2015) Authors: Jeong, Kwang-Seok; Kim, Yu-Mi; Lee, Ga-Won Journal: ECS journal of solid state science and technology Issue: Volume 4:Number 5(2015) Page Start: Q31 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Origin of Oxygen-Induced Abnormal Hump in Bottom-Gated Polycrystalline Zinc Oxide Thin Film Transistors. (1st January 2015) Authors: Jeong, Kwang-Seok; Kim, Yu-Mi; Lee, Ga-Won Journal: ECS journal of solid state science and technology Issue: Volume 4:Number 5(2015) Page Start: Q31 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗